{"title":"The effect of sea level cosmic rays on electronic devices","authors":"J. Ziegler, W. Lanford","doi":"10.1109/ISSCC.1980.1156060","DOIUrl":null,"url":null,"abstract":"The evaluation of the effects of cosmic rays on computer memories and its application to typical memory devices will be discussed. Conclusions indicate that cosmic ray nucleons and muons could have a significant effect on the next generation of computer memory circuitry. Error rates increase rapidly with altitude, offering the potential of accelerated testing to make electronic equipment less sensitive to the cosmic rays.","PeriodicalId":229101,"journal":{"name":"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"171","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1980.1156060","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 171
Abstract
The evaluation of the effects of cosmic rays on computer memories and its application to typical memory devices will be discussed. Conclusions indicate that cosmic ray nucleons and muons could have a significant effect on the next generation of computer memory circuitry. Error rates increase rapidly with altitude, offering the potential of accelerated testing to make electronic equipment less sensitive to the cosmic rays.