{"title":"Formal verification of superscalar microprocessors with multicycle functional units, exceptions, and branch prediction","authors":"M. Velev, R. Bryant","doi":"10.1145/337292.337331","DOIUrl":null,"url":null,"abstract":"We extend the Burch and Dill flushing technique [6] for formal verification of microprocessors to be applicable to designs where the functional units and memories have multicycle and possibly arbitrary latency. We also show ways to incorporate exceptions and branch prediction by exploiting the properties of the logic of Positive Equality with Uninterpreted Functions [4][5]. We study the modeling of the above features in different versions of dual-issue superscalar processors.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"114","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 37th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/337292.337331","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 114
Abstract
We extend the Burch and Dill flushing technique [6] for formal verification of microprocessors to be applicable to designs where the functional units and memories have multicycle and possibly arbitrary latency. We also show ways to incorporate exceptions and branch prediction by exploiting the properties of the logic of Positive Equality with Uninterpreted Functions [4][5]. We study the modeling of the above features in different versions of dual-issue superscalar processors.