Nanotip GaN pyramids formed by polarity-selective chemical etching

H. Ng, N. Weimann, A. Chowdhury, J. Shaw
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Abstract

In this paper we have systematically studied the chemical etching of Ga and N-polar GaN with KOH, varying as a parameter either the concentration or the temperature of the solution for a fixed etch duration. The growth polarity can be controlled by the deposition of an appropriate buffer layer during molecular beam epitaxy (MBE). Using a patterned template, we grown samples with adjacent Ga-and N-polar regions. The N-polar GaN was found to be selectively etched while the Ga-polar GaN remained intact. We have made preliminary measurements of electron field emission from the GaN nanotip pyramids. Anode was suspended 50-500/spl mu/m above the film and I-V measurements were made at 50/spl mu/m increments.
极性选择化学蚀刻形成的纳米尖GaN金字塔
在本文中,我们系统地研究了用KOH对Ga和n极性GaN的化学蚀刻,在固定的蚀刻时间内,改变溶液的浓度或温度作为参数。在分子束外延(MBE)过程中,可以通过沉积适当的缓冲层来控制生长极性。使用图案模板,我们培养了具有相邻ga和n极区域的样品。发现n极性GaN被选择性蚀刻,而ga极性GaN保持完整。我们对氮化镓纳米尖金字塔的电子场发射进行了初步测量。阳极悬浮在薄膜上方50-500/spl mu/m,以50/spl mu/m为增量进行I-V测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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