An Input Stage for the Implementation of Low-Voltage Rail to Rail Offset Compensated CMOS Comparators

Abstract

A rail-to-rail differential input stage with programmable threshold levels and offset compensation is introduced. Applications for the implementation of differential and double differential comparators are discussed. Experimental results obtained from a MOSIS 0.5 mum CMOS technology test chip are shown that validate rail-to-rail operation with a 1.5 V supply voltage.