Study of the 1D Scattering Mechanisms' Impact on the Mobility in Si Nanowire Transistors

C. Medina-Bailón, T. Sadi, M. Nedjalkov, J. Lee, S. Berrada, H. Carrillo-Nuñez, V. Georgiev, S. Selberherr, A. Asenov
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引用次数: 6

Abstract

The extensive research of aggressively scaled nano-electronic devices necessitates the inclusion of quantum confinement effects and their impact on performance. This work implements a set of multisubband phonon and impurity scattering mechanisms within the Kubo-Greenwood formalism in order to study their impact on the mobility in Si nanowire transistors (NWTs). This 1D treatment has been coupled with a 3D Poisson-2D Schrödinger solver, which accurately captures the effects of quantum confinement on charge dynamics. We also emphasize the importance of using the 1D models to evaluate the geometrical properties on mobility at the scaling limit.
一维散射机制对硅纳米线晶体管迁移率影响的研究
大规模纳米电子器件的广泛研究需要包含量子限制效应及其对性能的影响。本工作在Kubo-Greenwood形式下实现了一套多子带声子和杂质散射机制,以研究它们对硅纳米线晶体管(NWTs)迁移率的影响。这种1D处理与3D泊松- 2d Schrödinger求解器相结合,可以准确捕获量子约束对电荷动力学的影响。我们还强调了使用一维模型来评估尺度极限下迁移率几何特性的重要性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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