M. Tanaka, M. Toyama, Ryo Mori, H. Nakashima, M. Haida, I. Ooshima
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引用次数: 7
Abstract
With the advancements in semiconductor process technologies in recent years, many circuits are mounted on small dies and the number of interface pins has rapidly increased. The demand for smaller chip/package sizes has come about in order to reduce costs. This paper describes the early stage chip/package/board co-design techniques which reduce chip and package size by cutting down the number of PDN (Power Distribution Network) pads/balls and improve the routability of the package. The key techniques are early stage package/board properties estimation and IR drop estimation. These techniques have a good degree of accuracy even at early stage estimation and a short processing time. From experimental result using a 45-nm process TEG (Test Element Group) chip, the package size was reduced by 21.5%, and the chip size was reduced by 16.4% in comparison with the original design which was designed conventional techniques. The experimental result demonstrates the validation of the proposed techniques.
近年来,随着半导体工艺技术的进步,许多电路都安装在小芯片上,接口引脚数量迅速增加。为了降低成本,出现了对更小芯片/封装尺寸的需求。本文介绍了早期的芯片/封装/板协同设计技术,这些技术通过减少PDN(配电网络)垫/球的数量来减小芯片和封装的尺寸,并提高封装的可达性。关键技术是早期封装/板属性估计和红外下降估计。这些技术即使在早期估计阶段也具有很高的准确性和较短的处理时间。从实验结果来看,采用45纳米工艺的TEG (Test Element Group)芯片,与原设计相比,封装尺寸减小了21.5%,芯片尺寸减小了16.4%。实验结果验证了所提技术的有效性。