A high precision iddq measurement system with improved dynamic load regulation

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1270865

Nobuhiro Sato, Y. Hashimoto

引用次数: 0

Abstract

This paper describes a system for performing high precision IDDQ measurement of CMOS ICs having a large peak current during operation. Although the measurement rate is at a low speed of 200uS, the average current of up to 1A during operation may be accepted by improving the dynamic load regulation. This system is also applicable to conventional testing apparatus. This paper covers problems in IDDQ testing, solution for the problems, embodiment of each circuit, verijication of the results, conclusion and future issues.

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一种改进动态负载调节的高精度iddq测量系统

本文介绍了一种对工作中峰值电流较大的CMOS集成电路进行高精度IDDQ测量的系统。虽然测量速率为200uS的低速，但通过改进动态负载调节，可接受工作时平均电流高达1A。该系统也适用于常规检测仪器。本文涵盖了IDDQ测试中存在的问题、问题的解决方案、各电路的具体实现、结果的验证、结论和未来需要解决的问题。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

International Test Conference, 2003. Proceedings. ITC 2003.

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