Xiaofeng Su, Fan-sheng Chen, Sheng-Da Pan, Xueyi Gong, YucCui Dong
{"title":"The NUC and blind pixel eliminating in the DTDI application","authors":"Xiaofeng Su, Fan-sheng Chen, Sheng-Da Pan, Xueyi Gong, YucCui Dong","doi":"10.1117/12.2033714","DOIUrl":null,"url":null,"abstract":"AS infrared CMOS Digital TDI (Time Delay and integrate) has a simple structure, excellent performance and flexible operation, it has been used in more and more applications. Because of the limitation of the Production process level, the plane array of the infrared detector has a large NU (non-uniformity) and a certain blind pixel rate. Both of the two will raise the noise and lead to the TDI works not very well. In this paper, for the impact of the system performance, the most important elements are analyzed, which are the NU of the optical system, the NU of the Plane array and the blind pixel in the Plane array. Here a reasonable algorithm which considers the background removal and the linear response model of the infrared detector is used to do the NUC (Non-uniformity correction) process, when the infrared detector array is used as a Digital TDI. In order to eliminate the impact of the blind pixel, the concept of surplus pixel method is introduced in, through the method, the SNR (signal to noise ratio) can be improved and the spatial and temporal resolution will not be changed. Finally we use a MWIR (Medium Ware Infrared) detector to do the experiment and the result proves the effectiveness of the method.","PeriodicalId":334178,"journal":{"name":"Smart Materials, Nano-, and Micro- Smart Systems","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Smart Materials, Nano-, and Micro- Smart Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2033714","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
AS infrared CMOS Digital TDI (Time Delay and integrate) has a simple structure, excellent performance and flexible operation, it has been used in more and more applications. Because of the limitation of the Production process level, the plane array of the infrared detector has a large NU (non-uniformity) and a certain blind pixel rate. Both of the two will raise the noise and lead to the TDI works not very well. In this paper, for the impact of the system performance, the most important elements are analyzed, which are the NU of the optical system, the NU of the Plane array and the blind pixel in the Plane array. Here a reasonable algorithm which considers the background removal and the linear response model of the infrared detector is used to do the NUC (Non-uniformity correction) process, when the infrared detector array is used as a Digital TDI. In order to eliminate the impact of the blind pixel, the concept of surplus pixel method is introduced in, through the method, the SNR (signal to noise ratio) can be improved and the spatial and temporal resolution will not be changed. Finally we use a MWIR (Medium Ware Infrared) detector to do the experiment and the result proves the effectiveness of the method.
AS红外CMOS数字TDI (Time Delay and integration)具有结构简单、性能优异、操作灵活等优点,得到了越来越多的应用。由于生产工艺水平的限制,红外探测器的平面阵列存在较大的不均匀性和一定的盲像率。两者都会提高噪音,导致TDI工作不太好。本文分析了影响系统性能的最重要因素,即光学系统的NU、平面阵列的NU和平面阵列中的盲像元。当红外探测器阵列作为数字TDI时,采用一种考虑背景去除和红外探测器线性响应模型的合理算法进行非均匀性校正(NUC)处理。为了消除盲像元的影响,引入了剩余像元法的概念,通过该方法可以提高信噪比,而不会改变空间和时间分辨率。最后利用中红外(MWIR)探测器进行了实验,结果证明了该方法的有效性。