{"title":"Cutoff Rate Analysis of Amplify-and-Forward Relay System","authors":"K. Yar, Sumei Sun, P. Ho","doi":"10.1109/VETECF.2010.5594259","DOIUrl":null,"url":null,"abstract":"We derive in this paper the bit error probability and cutoff rate of an Amplify-and-Forward (AF) relay system operating in Rayleigh fast fading. In our model, we consider the relay thermal noise to be non-negligible and derive a closed form expression to approximate the bit error probability. Our approximated closed form expression matches well with simulation result. Using Chernoff bound, we upper bound its pairwise error probability and we also derive the cutoff rate of the AF relay system.","PeriodicalId":417714,"journal":{"name":"2010 IEEE 72nd Vehicular Technology Conference - Fall","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE 72nd Vehicular Technology Conference - Fall","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VETECF.2010.5594259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We derive in this paper the bit error probability and cutoff rate of an Amplify-and-Forward (AF) relay system operating in Rayleigh fast fading. In our model, we consider the relay thermal noise to be non-negligible and derive a closed form expression to approximate the bit error probability. Our approximated closed form expression matches well with simulation result. Using Chernoff bound, we upper bound its pairwise error probability and we also derive the cutoff rate of the AF relay system.