Performance Optimization of ZnO based Thin Film Transistor for Future Generation Display Technology

A. Singh, V.V. Kharche, P. Chakrabarti
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引用次数: 6

Abstract

Zinc oxide based thin-film transistors (TFT) built with an Al2O3insulator layer have been analyzed on Silvaco ATLAS™ 2D simulator in order to optimize their performance for application in display systems. We have optimized the geometry of the structure by varying the oxide thickness and semiconductor channel for achieving high performance switching application in display technology. The study revealed that the device can be successfully optimized to achieve a very high value of on-off ratio of $\sim 2.78\times 10^{8}$ to provide a better driving capability and yet maintaining a low sub-threshold voltage of 0.55 V/decade ensuring high speed of operation. The high performance ZnO based device proposed to be built on Al2O3insulator will make it cost-effective for large display systems.
面向下一代显示技术的ZnO薄膜晶体管性能优化
为了优化其在显示系统中的应用性能,在Silvaco ATLAS™2D模拟器上对采用al2o3绝缘层构建的氧化锌薄膜晶体管(TFT)进行了分析。我们通过改变氧化物厚度和半导体通道来优化结构的几何形状,以实现显示技术中的高性能开关应用。研究表明,该器件可以成功优化,实现2.78 × 10^{8}$的非常高的通断比,以提供更好的驱动能力,同时保持0.55 V/decade的低亚阈值电压,确保高速运行。在al2o3绝缘体上构建的高性能ZnO基器件将使其在大型显示系统中具有成本效益。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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