J. Juskowiak, V. Schweizer, M. Stohrer, B. Bertsche
{"title":"Reliability growth model in early design stages","authors":"J. Juskowiak, V. Schweizer, M. Stohrer, B. Bertsche","doi":"10.1109/RAMS.2013.6517687","DOIUrl":null,"url":null,"abstract":"In this paper, a new model for reliability growth planning in product development as well as a derived potential for its optimization are proposed. Unlike current models which do not have the ability to edit previous input data and thereby update the planning curve, the S-Planning-Curve (SPL), is proposed. Additionally, the SPL test results can be integrated as well. A delay before the beginning of the first test is also taken into account. The use of this integral approach and integration of known models, such as the continuous power law, make the SPL a powerful tool in product development. In addition the computer-based application can be easily used in practice. Because of its flexibility, the SPL model has advantages in different cases compared to the Modified Power Law and the modified IBM-Rosner Model. At the beginning of new complex products, it takes time to analyze the system thoroughly. Consequently this characteristic is implemented by the SPL. Furthermore, a delay time can be used to setup a test station. On the other hand, the SPL allows a response to a discrepancy between the actual and planned reliability at development time.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2013.6517687","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this paper, a new model for reliability growth planning in product development as well as a derived potential for its optimization are proposed. Unlike current models which do not have the ability to edit previous input data and thereby update the planning curve, the S-Planning-Curve (SPL), is proposed. Additionally, the SPL test results can be integrated as well. A delay before the beginning of the first test is also taken into account. The use of this integral approach and integration of known models, such as the continuous power law, make the SPL a powerful tool in product development. In addition the computer-based application can be easily used in practice. Because of its flexibility, the SPL model has advantages in different cases compared to the Modified Power Law and the modified IBM-Rosner Model. At the beginning of new complex products, it takes time to analyze the system thoroughly. Consequently this characteristic is implemented by the SPL. Furthermore, a delay time can be used to setup a test station. On the other hand, the SPL allows a response to a discrepancy between the actual and planned reliability at development time.