TESTABILITY FEATURES OF THE 68HC16Z1

J. Lyon, Michael E. Gladden, E. Hartung, Eric Hoang, K. Raghunathan
{"title":"TESTABILITY FEATURES OF THE 68HC16Z1","authors":"J. Lyon, Michael E. Gladden, E. Hartung, Eric Hoang, K. Raghunathan","doi":"10.1109/TEST.1991.519502","DOIUrl":null,"url":null,"abstract":"The purpose of this paper is to describe the testability features implemented in Motorola's recently completed design of a sixteen bit microcontroller, the 68HC16Z1. The discussion includes a brief introduction to the 68HC16Z1, test objectives and organization along with descriptions of design for test (DR) techniques and structures.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519502","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The purpose of this paper is to describe the testability features implemented in Motorola's recently completed design of a sixteen bit microcontroller, the 68HC16Z1. The discussion includes a brief introduction to the 68HC16Z1, test objectives and organization along with descriptions of design for test (DR) techniques and structures.
68hc16z1的可测试性特点
本文的目的是描述摩托罗拉最近完成的16位微控制器68HC16Z1的可测试性特征。讨论包括对68HC16Z1的简要介绍,测试目标和组织以及测试设计(DR)技术和结构的描述。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信