Cell-plate-line and bit-line complementarily sensed (CBCS) architecture for ultra low-power non-destructive DRAMs

T. Hamamoto, Y. Morooka, M. Asakura, H. Ozaki
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引用次数: 2

Abstract

In order to develop very high density DRAMs, the reduction of memory-array current, accounting for over 80% of total chip current, must be given serious consideration. As the number of activated sense-amplifiers (SAs) increase, the amount of consumed charge on bit-lines (BLs) increases accordingly. This paper describes a novel circuit design, called Cell-Plate-Line and Bit-Line Complementarily Sensed (CBCS) Architecture. Only the selected SA of a whole array is activated, thereby reducing array read/write current to below 1% compared with conventional ones. Furthermore, refresh operation can easily be executed and the array refresh current is reduced to below 50% without loss of the read-out differential signal.
超低功耗非破坏性dram的cell -板线和位线互补感测(CBCS)架构
为了开发超高密度的dram,必须认真考虑降低占芯片总电流80%以上的存储阵列电流。随着激活的感觉放大器(SAs)数量的增加,位线(BLs)上消耗的电荷量相应增加。本文介绍了一种新颖的电路设计,称为cell - board - line and Bit-Line互补感测(CBCS)架构。仅激活整个阵列中选定的SA,从而使阵列的读写电流与传统阵列相比降低到1%以下。此外,刷新操作可以很容易地执行并且阵列刷新电流降低到50%以下而不丢失读出差分信号。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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