One time programming (OTP) with Zener diodes in CMOS processes

J. Teichmann, K. Burger, W. Hasche, J. Herrfurth, G. Taschner
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引用次数: 7

Abstract

This article describes a lateral Zener diode in standard CMOS processes, without extra masks or technology steps, for one time programming (OTP) applications. The diode is adapted for programming (=zapping) requirements. The optimization of the device for low zapping currents and high yield is shown. The zapping process is evaluated in detail and follows an optimized layout and zapping conditions. The programming voltage is process dependent and lies between 6 V and 12 V, the zapping time is 1 /spl mu/s-4 /spl mu/s, and the required current is about 50 mA. The resistance of zapped diodes lies in the k/spl Omega/ range. The system needs only low voltage transistors, one extended drain medium voltage NMOS and one diode per bit. The selected diodes are introduced in several processes.
齐纳二极管在CMOS工艺中的一次性编程(OTP)
本文描述了标准CMOS工艺中的横向齐纳二极管,没有额外的掩模或技术步骤,用于一次性编程(OTP)应用。二极管适合编程(=zapping)的要求。并对该装置进行了优化,以达到低电流和高产量的目的。对冲压过程进行了详细的评估,并遵循优化的布局和冲压条件。编程电压与工艺有关,介于6 V和12 V之间,脉冲时间为1 /spl mu/s-4 /spl mu/s,所需电流约为50 mA。被击穿的二极管的电阻在k/spl ω /范围内。该系统只需要一个低压晶体管、一个扩展漏极中压NMOS和一个二极管。在几个过程中介绍了所选择的二极管。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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