{"title":"Fruit defect detection based on speeded up robust feature technique","authors":"Yogesh, Ashwani Kumar Dubey","doi":"10.1109/ICRITO.2016.7785023","DOIUrl":null,"url":null,"abstract":"This paper elaborated the fruit quality detection technique which was based on external properties of fruits such as shape, size and color. Due to large demand, manual monitoring of fruits are ineffectual for agriculture industry. So, it requires a competent technique which will help agriculture industry to full fill the demand of consumer. The proposed method is based on the use of speeded up robust feature. The method extracts the local feature of the segmented image and describes the object recognition. The objective is to design the defect detection algorithm which will be used for feature extraction and descriptor having less processing time.","PeriodicalId":377611,"journal":{"name":"2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICRITO.2016.7785023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 30
Abstract
This paper elaborated the fruit quality detection technique which was based on external properties of fruits such as shape, size and color. Due to large demand, manual monitoring of fruits are ineffectual for agriculture industry. So, it requires a competent technique which will help agriculture industry to full fill the demand of consumer. The proposed method is based on the use of speeded up robust feature. The method extracts the local feature of the segmented image and describes the object recognition. The objective is to design the defect detection algorithm which will be used for feature extraction and descriptor having less processing time.