A q-gram birthmarking approach to predicting reusable hardware

Kevin Zeng, P. Athanas
{"title":"A q-gram birthmarking approach to predicting reusable hardware","authors":"Kevin Zeng, P. Athanas","doi":"10.3850/9783981537079_0927","DOIUrl":null,"url":null,"abstract":"Designer productivity is a growing concern as over-all hardware complexity rises. Design reuse, a key component in productivity, is underutilized. Not only can existing designs be reused, but also the patterns and information contained within them as well. With the increase in the number of circuits available, there requires a need to analyze and retrieve designs with ease in order to accelerate design entry. In this paper, a birthmarking approach using q-grams is presented. Using this technique, design patterns regarding existing circuits can be captured and used to not only suggest similar and reusable designs, but functional blocks throughout the design phase, with little to no effort from the user. Preliminary experiments and case studies of the q-gram birthmarking technique were performed on over 250 circuits from various sources in order to show the feasibility of the proposed methods.","PeriodicalId":311352,"journal":{"name":"2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3850/9783981537079_0927","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Designer productivity is a growing concern as over-all hardware complexity rises. Design reuse, a key component in productivity, is underutilized. Not only can existing designs be reused, but also the patterns and information contained within them as well. With the increase in the number of circuits available, there requires a need to analyze and retrieve designs with ease in order to accelerate design entry. In this paper, a birthmarking approach using q-grams is presented. Using this technique, design patterns regarding existing circuits can be captured and used to not only suggest similar and reusable designs, but functional blocks throughout the design phase, with little to no effort from the user. Preliminary experiments and case studies of the q-gram birthmarking technique were performed on over 250 circuits from various sources in order to show the feasibility of the proposed methods.
预测可重用硬件的q-gram胎记方法
随着整体硬件复杂性的提高,设计师的工作效率日益受到关注。设计重用是提高生产力的一个关键组成部分,但没有得到充分利用。不仅可以重用现有的设计,而且还可以重用其中包含的模式和信息。随着可用电路数量的增加,需要更容易地分析和检索设计,以加快设计进入。本文提出了一种基于q-grams的胎记方法。使用这种技术,可以捕获有关现有电路的设计模式,并将其用于在整个设计阶段建议类似和可重用的设计,而且在整个设计阶段建议功能块,而用户几乎不需要付出任何努力。为了证明所提出方法的可行性,在250多个不同来源的电路上进行了q克胎记技术的初步实验和案例研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信