An 8-bit Analog-to-Digital Converter based on the voltage-dependent switching probability of a Magnetic Tunnel Junction

Abstract

In this work, we have experimentally demonstrated for the first time, an Analog-to-Digital Converter (ADC) based on the unique voltage-dependent switching probability of a Magnetic Tunnel Junction (MTJ). The switching probability was calculated by applying repetitive voltage pulses and measuring the resolved MTJ states in each sampling time window. Temperature sensitivity and MgO breakdown issues were minimized by optimizing the voltage pulse width. Circuit level techniques were utilized to improve the ADC linearity and increase the input voltage range. The proposed ADC achieves an 8-bit resolution with excellent linearity at 30 and 85°C.