An Area Equivalent WKB Approach to Calculate the B2B Tunneling Probability for a Numerical Robust Implementation in TFET Compact Models

F. Horst, A. Farokhnejad, B. Iñíguez, A. Kloes
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引用次数: 4

Abstract

This paper presents a novel approach to calculate the band-to-band (B2B) tunneling probability in tunnel-field effect transistors (TFETs) for the usage in compact models. The tunneling barrier is defined by a compact solution of the electrostatics and is approximated by an area equivalent triangular profile. For this profile the Wentzel-Kramers-Brillouin approximation (WKB) is applied. Referring to the area instead of the electric field at single points is shown to be more robust regarding numerical stability. By comparing the results of the approach with numerical TCAD Sentaurus simulation data of a double-gate (DG) TFET for various bias conditions and geometric positions within the device, the numerical stability as well as the limitations are demonstrated. Furthermore, the comparison to a quasi-2D WKB approach, the derived model shows a better fit to TCAD data at a reduced complexity.
利用面积等效WKB方法计算ttfet紧凑模型中数值鲁棒实现的B2B隧道概率
本文提出了一种计算隧道场效应晶体管(tfet)中带到带(B2B)隧穿概率的新方法。隧道势垒由静电的紧解来定义,并由面积等效三角形轮廓来近似。对于这个剖面应用了wentzel - kramer - brillouin近似(WKB)。在数值稳定性方面,参考面积而不是单点电场显示出更强的鲁棒性。通过与双栅(DG) TFET在不同偏置条件和器件内几何位置下的TCAD Sentaurus数值模拟数据进行比较,证明了该方法的数值稳定性和局限性。此外,与准二维WKB方法相比,该模型在降低复杂性的情况下能更好地拟合TCAD数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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