S. Hijiya, T. Ito, T. Nakamura, N. Toyokura, H. Ishikawa
{"title":"Electrically alterable read-only memory cell with graded energy band-gap insulator","authors":"S. Hijiya, T. Ito, T. Nakamura, N. Toyokura, H. Ishikawa","doi":"10.1109/IEDM.1980.189902","DOIUrl":null,"url":null,"abstract":"Low voltage alterability and excellent memory retention have been obtained with a novel EAROM cell that has a graded energy band-gap film as the first insulator of a Floating-Gate type memory. The graded energy band-gap insulator can enhance charge injection without deteriorating memory retention, because the energy band-gap is narrowed only at the silicon substrate interface. A graded energy band-gap insulator has been realized by thermally oxidizing the surface of a very thin silicon nitride film grown by direct thermal nitridation of a silicon substrate. A fabricated EAROM cell has shown that it can be programmed by a single positive supply of less than 12 V and it has excellent memory retention.","PeriodicalId":180541,"journal":{"name":"1980 International Electron Devices Meeting","volume":"73 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1980 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1980.189902","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Low voltage alterability and excellent memory retention have been obtained with a novel EAROM cell that has a graded energy band-gap film as the first insulator of a Floating-Gate type memory. The graded energy band-gap insulator can enhance charge injection without deteriorating memory retention, because the energy band-gap is narrowed only at the silicon substrate interface. A graded energy band-gap insulator has been realized by thermally oxidizing the surface of a very thin silicon nitride film grown by direct thermal nitridation of a silicon substrate. A fabricated EAROM cell has shown that it can be programmed by a single positive supply of less than 12 V and it has excellent memory retention.