{"title":"Structural, optical and morphological study of oxide materials","authors":"A. Deepa, C. Gopinathan, P. Pandi","doi":"10.12988/AAP.2019.932","DOIUrl":null,"url":null,"abstract":"Various oxide nanomaterials like TiO 2, NiO, WO 3 and Co 3 O 4 are synthesized by doctor blade technique. Structural investigation is performed with the aid of X-ray diffraction measurements. The results obtained from this method revealed that as-deposited films are crystalline nature. Using the Debye–Scherer’s equation, the average size of the crystallites is measured. Optical properties are determined by absorption measurements in the spectral range from 200 to 900 nm. The surface features are investigated by optical microscopic techniques such as scanning electron microscopy (SEM) and atomic force microscopy (AFM). The efficiency of the thin film Solar Cell is measured by Current density – Voltage (J-V) characteristics.","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ADVANCES IN APPLIED PHYSICS","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12988/AAP.2019.932","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Various oxide nanomaterials like TiO 2, NiO, WO 3 and Co 3 O 4 are synthesized by doctor blade technique. Structural investigation is performed with the aid of X-ray diffraction measurements. The results obtained from this method revealed that as-deposited films are crystalline nature. Using the Debye–Scherer’s equation, the average size of the crystallites is measured. Optical properties are determined by absorption measurements in the spectral range from 200 to 900 nm. The surface features are investigated by optical microscopic techniques such as scanning electron microscopy (SEM) and atomic force microscopy (AFM). The efficiency of the thin film Solar Cell is measured by Current density – Voltage (J-V) characteristics.