I-V Method Based PDN Impedance Measurement Technique and Associated Probe Design

Xiaolu Zhu, Ling Zhang, Yuandong Guo, Pengyu Wei, Richard Zai, J. Drewniak, D. Pommerenke
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引用次数: 1

Abstract

In this paper I-V method-based impedance measurement of power distribution network (PDN) in printed circuit board (PCB) technique is proposed and compared to the traditional VNA method [1]. A I-V method-based probe is designed and verified by comparing the performance with VNA method. To de-embed the parasitic problems, a special I-V probe calibration method is created according to the characteristics of the probe.
基于I-V法的PDN阻抗测量技术及探头设计
本文提出了一种基于I-V法的配电网络阻抗测量方法,并与传统的VNA方法[1]进行了比较。设计了一种基于I-V法的探针,并与VNA法进行了性能比较。为了解决寄生问题,根据探针的特点,提出了一种特殊的I-V探针标定方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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