Thermal analysis of a chip on board (COB)

J. De Moerloose, W. Temmerman
{"title":"Thermal analysis of a chip on board (COB)","authors":"J. De Moerloose, W. Temmerman","doi":"10.1109/STHERM.1997.566788","DOIUrl":null,"url":null,"abstract":"While solving many of today's chip interconnection problems, MCM technology presents major challenges with respect to thermal compatibility. The high power dissipation on a very limited area in many cases forces additional cooling measures such as thermal vias and heat sinks. Whether such measures should be applied or not and, if so, where to apply them, are just some of the questions that have to be answered in the design process. Fortunately, new tools are coming to the aid of the designer. Current CFD software has evolved in such a way that a detailed simulation of a single chip on the scale of a module is no longer beyond our reach. In this paper we present a set of simulations (using the CFD software FLOTHERM) that were performed on a typical chip-on-board implementation of a clock function for a broadband fine-board. Junction temperatures are calculated for different types of heat sinks. In the second part of the paper, some experiments on a thermal test module are described and the thermal resistance of each chip was determined for different MCM-L thermal technologies.","PeriodicalId":126120,"journal":{"name":"Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth Annual IEEE. Semiconductor Thermal Measurement and Management Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1997.566788","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

While solving many of today's chip interconnection problems, MCM technology presents major challenges with respect to thermal compatibility. The high power dissipation on a very limited area in many cases forces additional cooling measures such as thermal vias and heat sinks. Whether such measures should be applied or not and, if so, where to apply them, are just some of the questions that have to be answered in the design process. Fortunately, new tools are coming to the aid of the designer. Current CFD software has evolved in such a way that a detailed simulation of a single chip on the scale of a module is no longer beyond our reach. In this paper we present a set of simulations (using the CFD software FLOTHERM) that were performed on a typical chip-on-board implementation of a clock function for a broadband fine-board. Junction temperatures are calculated for different types of heat sinks. In the second part of the paper, some experiments on a thermal test module are described and the thermal resistance of each chip was determined for different MCM-L thermal technologies.
板上芯片(COB)的热分析
虽然解决了当今许多芯片互连问题,但MCM技术在热兼容性方面提出了重大挑战。在许多情况下,在非常有限的面积上的高功率耗散迫使采取额外的冷却措施,如热通孔和散热器。是否应该应用这些措施,如果是,在哪里应用它们,只是在设计过程中必须回答的一些问题。幸运的是,新的工具正在帮助设计师。当前的CFD软件已经发展到这样一种程度,在一个模块的规模上对单个芯片进行详细的模拟不再是我们无法企及的。在本文中,我们提出了一组模拟(使用CFD软件FLOTHERM),对宽带细板时钟功能的典型片上实现进行了模拟。结温计算不同类型的散热器。在论文的第二部分,介绍了热测试模块上的一些实验,并对不同MCM-L热技术下每个芯片的热阻进行了测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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