Principles of operation and prospects for the development of laser lithographic systems for the synthesis of optical elements

V. Khomutov, R. Shimansky, R. K. Nasyrov, V. Korolkov
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引用次数: 2

Abstract

The development and research of new devices and systems of diffractive and integrated optics, which based on elements with thin-layer micro- and nanostructures, requires the improvement of the technological base. The most massive and lowcost is planar optical elements, on the surface of which diffractive and raster computer-synthesized micro- and nanostructures are formed, as well as structures based on synthesized metamaterials. In recent years, off-axis and axisymmetric computer-synthesized holograms for control and alignment of optical systems, microstructured optical elements with 3D microrelief for complex transformations of wavefronts and intensity distributions of light beams (micro-optics), integrated-optical passive and active circuits have been greatly developed. In this paper describes the principles of operation of two different scanning laser nanolithography system developed operating in a writing and polar coordinate system. Development and research work these lithographic systems were conducted at the Institute of Automation and Electrometry of the SB RAS for many years. The areas of applicability of these systems are described, their differences and technical limitations are considered. The emphasis is made on fundamentally similar units of installations of this class and the prerequisites for their unification are considered. Methods for increasing their resolution, speed and accuracy of writing are proposed, prospects and directions of their development are analyzed. The results of writing test optical elements on metal films using the described methods are demonstrated.
光学元件合成激光光刻系统的工作原理及发展前景
基于薄层微纳米结构元件的衍射光学和集成光学新器件和新系统的开发和研究,需要提高技术基础。最大规模和低成本的是平面光学元件,在其表面形成衍射和光栅计算机合成的微纳米结构,以及基于合成超材料的结构。近年来,用于光学系统控制和对准的离轴和轴对称计算机合成全息图、用于复杂波前变换和光束强度分布的三维微凸透镜微结构光学元件(微光学)、集成光无源和有源电路等得到了很大的发展。本文介绍了两种不同的扫描激光纳米光刻系统的工作原理,分别在书写和极坐标系下工作。这些光刻系统的开发和研究工作在SB RAS的自动化和电测量研究所进行了多年。描述了这些系统的适用领域,并考虑了它们的差异和技术限制。重点是在基本类似的单位安装这类和先决条件的统一考虑。提出了提高其分辨率、书写速度和准确性的方法,并对其发展前景和方向进行了分析。最后给出了用所述方法在金属薄膜上书写测试光学元件的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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