Temporal and spatial idleness exploitation for optimal-grained leakage control

Hao Xu, R. Vemuri, W. Jone
{"title":"Temporal and spatial idleness exploitation for optimal-grained leakage control","authors":"Hao Xu, R. Vemuri, W. Jone","doi":"10.1145/1687399.1687487","DOIUrl":null,"url":null,"abstract":"Runtime leakage control techniques, such as power gating (PG) and body biasing (BB), have been applied in a coarse-grained manner traditionally. In order to enable more aggressive leakage reduction, researchers are seeking ways to control leakage with finer granularity. Our research proposes two novel methods, namely circuit clustering for temporal and spatial idleness exploitation, to systematically reduce the granularity of leakage control and improve leakage reduction. Another strength of this paper is the quantitative study of leakage saving and control cost by leakage control with different granularity. With our quantitative study, designers can make the trade-off between leakage saving and control cost, and decide the optimum granularity for leakage control. A heuristic algorithm has been developed to automate the two circuit clustering methods and determine the optimum granularity for any given circuit. The analysis and experiments of this paper is mainly based on RBB. They are also applicable to PG by modifying the cost function.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"8 8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1687399.1687487","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

Runtime leakage control techniques, such as power gating (PG) and body biasing (BB), have been applied in a coarse-grained manner traditionally. In order to enable more aggressive leakage reduction, researchers are seeking ways to control leakage with finer granularity. Our research proposes two novel methods, namely circuit clustering for temporal and spatial idleness exploitation, to systematically reduce the granularity of leakage control and improve leakage reduction. Another strength of this paper is the quantitative study of leakage saving and control cost by leakage control with different granularity. With our quantitative study, designers can make the trade-off between leakage saving and control cost, and decide the optimum granularity for leakage control. A heuristic algorithm has been developed to automate the two circuit clustering methods and determine the optimum granularity for any given circuit. The analysis and experiments of this paper is mainly based on RBB. They are also applicable to PG by modifying the cost function.
利用时间和空间空闲进行最佳粒度泄漏控制
运行时泄漏控制技术,如功率门控(PG)和体偏置(BB),传统上以粗粒度的方式应用。为了更有效地减少泄漏,研究人员正在寻找更细粒度控制泄漏的方法。本研究提出了两种新颖的方法,即基于时间空闲的电路聚类方法和基于空间空闲的电路聚类方法,以系统地降低泄漏控制的粒度,提高泄漏降低率。本文的另一个长处是通过不同粒度的泄漏控制对泄漏节约和控制成本进行定量研究。通过定量研究,设计人员可以在泄漏节约和控制成本之间进行权衡,确定泄漏控制的最佳粒度。开发了一种启发式算法,使两种电路聚类方法自动化,并确定任意给定电路的最佳粒度。本文的分析和实验主要基于RBB。通过修改代价函数,也适用于PG。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
4.60
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信