Static test compaction for transition faults under the hazard-based detection conditions

I. Pomeranz
{"title":"Static test compaction for transition faults under the hazard-based detection conditions","authors":"I. Pomeranz","doi":"10.1109/VTS.2012.6231099","DOIUrl":null,"url":null,"abstract":"The conventional detection conditions for transition faults require a transition at the fault site for activating a fault. The hazard-based detection conditions allow a transition fault to be activated by a pulse. Earlier, the hazard-based detection conditions were used for obtaining more accurate estimates of transition fault coverage and for more accurate defect diagnosis. This paper considers their use for test compaction. The procedure described in this paper replaces the conventional detection conditions with the hazard-based detection conditions for some faults. The use of the hazard-based detection conditions allows each test to detect more faults, thus allowing the number of tests to be reduced.","PeriodicalId":169611,"journal":{"name":"2012 IEEE 30th VLSI Test Symposium (VTS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 30th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2012.6231099","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

The conventional detection conditions for transition faults require a transition at the fault site for activating a fault. The hazard-based detection conditions allow a transition fault to be activated by a pulse. Earlier, the hazard-based detection conditions were used for obtaining more accurate estimates of transition fault coverage and for more accurate defect diagnosis. This paper considers their use for test compaction. The procedure described in this paper replaces the conventional detection conditions with the hazard-based detection conditions for some faults. The use of the hazard-based detection conditions allows each test to detect more faults, thus allowing the number of tests to be reduced.
基于危害检测条件下的过渡故障静态压实试验
传统的过渡性故障检测条件要求在故障点发生过渡性故障才能触发故障。基于危险的检测条件允许通过脉冲激活过渡故障。早先,基于危险的检测条件被用于获得更准确的过渡故障覆盖估计和更准确的缺陷诊断。本文考虑了它们在试验压实中的应用。本文所描述的过程用基于危害的故障检测条件代替了传统的故障检测条件。使用基于危险的检测条件允许每次测试检测更多的故障,从而允许减少测试的数量。
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