Congestion and Timing Aware Macro Placement Using Machine Learning Predictions from Different Data Sources: Cross-design Model Applicability and the Discerning Ensemble

Xiang Gao, Yi-Min Jiang, Lixin Shao, Pedja Raspopovic, M. E. Verbeek, Manish Sharma, Vineet Rashingkar, Amit Jalota
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引用次数: 6

Abstract

Modern very large-scale integration (VLSI) designs typically use a lot of macros (RAM, ROM, IP) that occupy a large portion of the core area. Also, macro placement being an early stage of the physical design flow, followed by standard cell placement, physical synthesis (place-opt), clock tree synthesis and routing, etc., has a big impact on the final quality of result (QoR). There is a need for Electronic Design Automation (EDA) physical design tools to provide predictions for congestion, timing, and power etc., with certainty for different macro placements before running time-consuming flows. However, the diversity of IC designs that commercial EDA tools must support and the limited number of similar designs that can provide training data, make such machine learning (ML) predictions extremely hard. Because of this, ML models usually need to be completely retrained for unseen designs to work properly. However, collecting full flow macro placement ML data is time consuming and impractical. To make things worse, common ML methods, such as regression, support vector machine (SVM), random forest (RF), neural network (NN) in general, lack a good estimation of prediction accuracy or confidence and lack debuggability for cross-design applications. In this paper, we present a novel discerning ensemble technique for cross-design ML prediction for macro placement. We developed our solution based on a large number of designs with different design styles and technology nodes, and tested the solution on 8 leading-edge industry designs and achieved comparable or even better results in a few hours (per design) than manual placement results that take many engineers weeks or even months to achieve. Our method shows great promise for many ML problems in EDA applications, or even in other areas.
使用来自不同数据源的机器学习预测的拥塞和定时感知宏放置:跨设计模型适用性和识别集成
现代超大规模集成电路(VLSI)设计通常使用大量宏(RAM, ROM, IP),这些宏占据了很大一部分核心区域。此外,宏放置是物理设计流程的早期阶段,其次是标准单元放置、物理合成(place-opt)、时钟树合成和路由等,这对最终结果质量(QoR)有很大影响。需要电子设计自动化(EDA)物理设计工具来提供对拥塞、时序和功耗等的预测,并在运行耗时流之前确定不同的宏放置位置。然而,商业EDA工具必须支持的IC设计的多样性以及可以提供训练数据的类似设计的数量有限,使得这种机器学习(ML)预测非常困难。正因为如此,机器学习模型通常需要完全重新训练,以使看不见的设计正常工作。然而,收集完整的宏放置ML数据既耗时又不切实际。更糟糕的是,常见的机器学习方法,如回归、支持向量机(SVM)、随机森林(RF)、神经网络(NN),通常缺乏对预测准确性或置信度的良好估计,并且缺乏跨设计应用程序的可调试性。在本文中,我们提出了一种新的识别集成技术,用于宏放置的交叉设计ML预测。我们基于大量具有不同设计风格和技术节点的设计开发了我们的解决方案,并在8个领先的行业设计上测试了该解决方案,并在几个小时内(每个设计)获得了与人工放置结果相当甚至更好的结果,而人工放置结果需要许多工程师花费数周甚至数月才能实现。我们的方法对EDA应用中的许多ML问题,甚至在其他领域都显示出很大的希望。
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