STUDIES OF THERMOMETRIC MATERIAL Lu1-xZrxNiSb

V. Pashkevych, V. Krayovskyy, M. Rokomanyuk, Petro Haranuk, V. Romaka, Y. Stadnyk, L. Romaka, A. Horyn, D. Fruchart
{"title":"STUDIES OF THERMOMETRIC MATERIAL Lu1-xZrxNiSb","authors":"V. Pashkevych, V. Krayovskyy, M. Rokomanyuk, Petro Haranuk, V. Romaka, Y. Stadnyk, L. Romaka, A. Horyn, D. Fruchart","doi":"10.23939/istcmtm2022.01.010","DOIUrl":null,"url":null,"abstract":"The results of experimental research of perspective thermometric material Lu1-xZrxNiSbwhich can be used for the production of sensitive elements of thermoelectric and electroresistive thermometers are presented. Thermometric materials Lu1-xZrxNiSb, x=0.01–0.10, were made by fusing a charge of components in an electric arc furnace with a tungsten electrode (cathode) in an atmosphere of purified argon under a pressure of 0.1 kPa on a copper water-cooled hearth (anode). Heat treatment of alloys consisted of homogenizing annealing at a temperature of 1073 K. Annealing of samples was carried out for 720 h in vacuumed up to 1.0 Pa ampoules of quartz glass in muffle electric furnaces with temperature control with an accuracy of ±10 K. Diffraction arrays were obtained on a diffractometer DRON-4.0 (FeKα radiation), and the structural characteristics of Lu1-xZrxNiSbwere calculated using the Fullprof program. The chemical and phase compositions of the samples were monitored using a scanning electron microscope (Tescan Vega 3 LMU). The study of the temperature dependences of the resistivity ρ(T,x) and the thermopower coefficientα(T,x) Lu1-xZrxNiSb was performed in the temperature range of 80÷400 K on samples in the form of rectangular parallelepipeds measuring ~1.0×1.0×5.0 mm3 . Measurements of the values of the specific magnetic susceptibility χ(x) of Lu1-xZrxNiSb samples were performed by the relative Faraday method at a temperature of 273 K using a thermogravimetric installation with an electronic microbalance EM-5-ZMP in magnetic fields up to 10 kGs. Microprobe analysis of the concentration of atoms on the surface of Lu1-xZrxNiSb samples, x=0.01–0.10, established their correspondence to the initial compositions of the charge, and X-ray phase analysis showed no traces of extraneous phases on the sample diffractograms, except for the main phase. The nonmonotonic nature of the change in the values of the unit cell period of the thermometric material an (x) Lu1-xZrxNiSb, x=0.01–0.10, which differs from the results of modeling structural characteristics using software packages AkaiKKR and Elk. The nonmonotonic change in the values of the period of the unit cell a(x) Lu1-xZrxNiSband the presence of the extremum dependence suggests that the impurity Zr atoms introduced into the matrix of the LuNiSb basic semiconductor can simultaneously occupy partially different crystallographic positions in different ratios. The temperature resistivities ρ and the thermopower coefficientα of the LuNiSb base semiconductor contain high- and lowtemperature activation regions, which is characteristic of doped and compensated semiconductors. The introduction into the LuNiSb structure of the lowest concentration of impurity Zr atoms in the experiment (x=0.01) radically changes both the behavior of the temperature dependences of the resistivity ρ and the thermopower coefficientα and the type of the main electric current carriers. The values of the resistivity ρ(T,x) Lu1-xZrxNiSbonly increase with increasing temperature, which is characteristic of the metallic type of electrical conductivity and is due to the mechanisms of scattering of current carriers. This nature of the change in electrical resistance ρ(T,x) is evidence that the Fermi level εF has left the bandgap εg and is in the conduction band εC. This is indicated by the negative values of thermopower coefficientα(T,x) at all concentrations and temperatures. Studies of the magnetic susceptibility χ(x) showed that the samples as a basic semiconductor LuNiSb, as well as the thermometric material Lu1-xZrxNiSb, at all concentrations of impurities Zr, are Pauli paramagnetic. There is a synchronicity of the behavior of χ(x) with the dependences of the resistivity ρ(x, T) and the thermopower coefficient α(x, T), which is due to the change in the density of states at the Fermi level g(εF). The results of experimental studies of the Lu1-xZrxNiSbthermometric material completely coincide with the results of modeling its kinetic characteristics under the presence of vacancies in the crystallographic positions 4a and 4c of the Lu and Ni atoms, respectively. Such studies allow making adjustments in the structural studies of thermometric material with an accuracy that significantly exceeds the accuracy of X-ray research methods. The obtained results will allow us to clarify the spatial arrangement of atoms in the nodes of the unit cell, as well as to identify the mechanisms of electrical conductivity to determine the conditions for the synthesis of thermosensitive materials with maximum efficiency of thermal energy conversion into electricity.","PeriodicalId":415989,"journal":{"name":"Measuring Equipment and Metrology","volume":"130 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measuring Equipment and Metrology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23939/istcmtm2022.01.010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The results of experimental research of perspective thermometric material Lu1-xZrxNiSbwhich can be used for the production of sensitive elements of thermoelectric and electroresistive thermometers are presented. Thermometric materials Lu1-xZrxNiSb, x=0.01–0.10, were made by fusing a charge of components in an electric arc furnace with a tungsten electrode (cathode) in an atmosphere of purified argon under a pressure of 0.1 kPa on a copper water-cooled hearth (anode). Heat treatment of alloys consisted of homogenizing annealing at a temperature of 1073 K. Annealing of samples was carried out for 720 h in vacuumed up to 1.0 Pa ampoules of quartz glass in muffle electric furnaces with temperature control with an accuracy of ±10 K. Diffraction arrays were obtained on a diffractometer DRON-4.0 (FeKα radiation), and the structural characteristics of Lu1-xZrxNiSbwere calculated using the Fullprof program. The chemical and phase compositions of the samples were monitored using a scanning electron microscope (Tescan Vega 3 LMU). The study of the temperature dependences of the resistivity ρ(T,x) and the thermopower coefficientα(T,x) Lu1-xZrxNiSb was performed in the temperature range of 80÷400 K on samples in the form of rectangular parallelepipeds measuring ~1.0×1.0×5.0 mm3 . Measurements of the values of the specific magnetic susceptibility χ(x) of Lu1-xZrxNiSb samples were performed by the relative Faraday method at a temperature of 273 K using a thermogravimetric installation with an electronic microbalance EM-5-ZMP in magnetic fields up to 10 kGs. Microprobe analysis of the concentration of atoms on the surface of Lu1-xZrxNiSb samples, x=0.01–0.10, established their correspondence to the initial compositions of the charge, and X-ray phase analysis showed no traces of extraneous phases on the sample diffractograms, except for the main phase. The nonmonotonic nature of the change in the values of the unit cell period of the thermometric material an (x) Lu1-xZrxNiSb, x=0.01–0.10, which differs from the results of modeling structural characteristics using software packages AkaiKKR and Elk. The nonmonotonic change in the values of the period of the unit cell a(x) Lu1-xZrxNiSband the presence of the extremum dependence suggests that the impurity Zr atoms introduced into the matrix of the LuNiSb basic semiconductor can simultaneously occupy partially different crystallographic positions in different ratios. The temperature resistivities ρ and the thermopower coefficientα of the LuNiSb base semiconductor contain high- and lowtemperature activation regions, which is characteristic of doped and compensated semiconductors. The introduction into the LuNiSb structure of the lowest concentration of impurity Zr atoms in the experiment (x=0.01) radically changes both the behavior of the temperature dependences of the resistivity ρ and the thermopower coefficientα and the type of the main electric current carriers. The values of the resistivity ρ(T,x) Lu1-xZrxNiSbonly increase with increasing temperature, which is characteristic of the metallic type of electrical conductivity and is due to the mechanisms of scattering of current carriers. This nature of the change in electrical resistance ρ(T,x) is evidence that the Fermi level εF has left the bandgap εg and is in the conduction band εC. This is indicated by the negative values of thermopower coefficientα(T,x) at all concentrations and temperatures. Studies of the magnetic susceptibility χ(x) showed that the samples as a basic semiconductor LuNiSb, as well as the thermometric material Lu1-xZrxNiSb, at all concentrations of impurities Zr, are Pauli paramagnetic. There is a synchronicity of the behavior of χ(x) with the dependences of the resistivity ρ(x, T) and the thermopower coefficient α(x, T), which is due to the change in the density of states at the Fermi level g(εF). The results of experimental studies of the Lu1-xZrxNiSbthermometric material completely coincide with the results of modeling its kinetic characteristics under the presence of vacancies in the crystallographic positions 4a and 4c of the Lu and Ni atoms, respectively. Such studies allow making adjustments in the structural studies of thermometric material with an accuracy that significantly exceeds the accuracy of X-ray research methods. The obtained results will allow us to clarify the spatial arrangement of atoms in the nodes of the unit cell, as well as to identify the mechanisms of electrical conductivity to determine the conditions for the synthesis of thermosensitive materials with maximum efficiency of thermal energy conversion into electricity.
测温材料Lu1-xZrxNiSb的研究
介绍了可用于制作热电式和电阻式温度计敏感元件的透视测温材料lu1 - xzrxnisb的实验研究结果。测温材料Lu1-xZrxNiSb, x= 0.01-0.10,是在电弧炉中用钨电极(阴极)在净化氩气氛下,在铜水冷炉(阳极)上,以0.1 kPa的压力熔合成的。合金的热处理是在1073 K的温度下均匀退火。在温度控制精度为±10 K的马弗电炉中,将样品在真空至1.0 Pa的石英玻璃安瓿中退火720小时。在DRON-4.0 (FeKα辐射)衍射仪上获得了衍射阵列,并使用Fullprof程序计算了lu1 - xzrxnisb的结构特征。利用扫描电子显微镜(Tescan Vega 3lmu)对样品的化学成分和物相组成进行了监测。在80÷400 K温度范围内,研究了电阻率ρ(T,x)和热功率系数α(T,x) Lu1-xZrxNiSb对测量~1.0×1.0×5.0 mm3的矩形平行六面体试样的温度依赖性。采用相对法拉第法,在273 K的温度下,用电子微天平EM-5-ZMP在10 kg的磁场下测量了Lu1-xZrxNiSb样品的比磁化率χ(x),并对Lu1-xZrxNiSb样品表面原子浓度(x = 0.01-0.10)进行了微探针分析,确定了它们与电荷初始组成的对应关系。x射线相分析表明,除了主相外,样品的衍射图上没有其他相的痕迹。测温材料的单位胞周期值变化的非单调性和(x) Lu1-xZrxNiSb, x= 0.01-0.10,这与使用AkaiKKR和Elk软件包建模结构特征的结果不同。单元胞a(x) lu1 - xzrxnis带周期值的非单调变化和极值依赖性的存在表明,杂质Zr原子可以同时以不同的比例部分地占据LuNiSb基本半导体基体的不同晶体位置。LuNiSb基半导体的温度电阻率ρ和热功率系数α包含高低温活化区,这是掺杂和补偿半导体的特征。将实验中杂质Zr原子的最低浓度(x=0.01)引入到LuNiSb结构中,从根本上改变了电阻率ρ和热功率系数α的温度依赖行为以及主要载流子的类型。电阻率ρ(T,x) Lu1-xZrxNiSbonly随温度升高而增大,这是金属型电导率的特征,是由于载流子的散射机制所致。电阻ρ(T,x)变化的性质证明费米能级εF已离开带隙εg而在导带εC内。在所有浓度和温度下,热功率系数α(T,x)的负值表明了这一点。磁化率χ(x)的研究表明,样品作为基本半导体LuNiSb,以及测温材料Lu1-xZrxNiSb,在所有浓度的杂质Zr下都具有泡利顺磁性。χ(x)的行为与电阻率ρ(x, T)和热功率系数α(x, T)的依赖关系具有同步性,这是由于费米能级态密度g(εF)的变化所致。对lu1 - xzrxnisb测温材料的实验研究结果与对其在Lu和Ni原子的晶体位置4a和4c分别存在空位时的动力学特性的建模结果完全吻合。这样的研究允许对测温材料的结构研究进行调整,其精度大大超过x射线研究方法的精度。所获得的结果将使我们能够澄清单位电池节点中原子的空间排列,以及确定电导率机制,以确定合成热敏材料的条件,使热能转化为电能的效率达到最高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信