{"title":"Comparison of measurement results and simulations based on finite element method for an electrical capacitance tomography system","authors":"G. Holler, A. Fuchs, B. Schweighofer, G. Brasseur","doi":"10.1109/SFICON.2004.1287141","DOIUrl":null,"url":null,"abstract":"Electrical capacitance tomography (ECT) systems require multiple inter-electrode capacitance measurements or multiple electrode potential measurements as input for their reconstruction algorithms. The paper describes the electronic circuitry developed to provide the required data for the Gauss-Newton type reconstruction algorithm used at the Institute, as well as the models for simulating the sensor geometry and the electronic circuitry. The short-and long-term stability of the circuitry is analyzed. Furthermore, the electrode voltages predicted by simulations are compared to the measured potentials.","PeriodicalId":381233,"journal":{"name":"ISA/IEEE Sensors for Industry Conference, 2004. Proceedings the","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISA/IEEE Sensors for Industry Conference, 2004. Proceedings the","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SFICON.2004.1287141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Electrical capacitance tomography (ECT) systems require multiple inter-electrode capacitance measurements or multiple electrode potential measurements as input for their reconstruction algorithms. The paper describes the electronic circuitry developed to provide the required data for the Gauss-Newton type reconstruction algorithm used at the Institute, as well as the models for simulating the sensor geometry and the electronic circuitry. The short-and long-term stability of the circuitry is analyzed. Furthermore, the electrode voltages predicted by simulations are compared to the measured potentials.