{"title":"Hybrid On-Line Self-Test Strategy for Dual-Core Lockstep Processors","authors":"A. Floridia, E. Sánchez","doi":"10.1109/DFT.2018.8602982","DOIUrl":null,"url":null,"abstract":"Multi-core processors are increasingly becoming popular even in safety-critical applications, and the compliance of such systems with functional safety standards is thus mandatory. The targeted reliability figures are achieved with a combination of different solutions, in particular a largely employed one is named Dual-Core Lockstep (DCLS) configuration. In this paper, a hybrid scheme for the on-line testing of the lockstep logic is proposed, allowing for non-intrusive run-time test of lockstep comparators. The proposed solution leverages test programs developed according to the Software-Based Self-Test (SBST) approach, used in conjunction with a specialized hardware module. The effectiveness of this approach was assessed on a modified version of the OpenRISC 1200 processor, considering stuck-at faults only.","PeriodicalId":297244,"journal":{"name":"2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2018.8602982","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Multi-core processors are increasingly becoming popular even in safety-critical applications, and the compliance of such systems with functional safety standards is thus mandatory. The targeted reliability figures are achieved with a combination of different solutions, in particular a largely employed one is named Dual-Core Lockstep (DCLS) configuration. In this paper, a hybrid scheme for the on-line testing of the lockstep logic is proposed, allowing for non-intrusive run-time test of lockstep comparators. The proposed solution leverages test programs developed according to the Software-Based Self-Test (SBST) approach, used in conjunction with a specialized hardware module. The effectiveness of this approach was assessed on a modified version of the OpenRISC 1200 processor, considering stuck-at faults only.