New design of transient-noise detection circuit with SCR device for system-level ESD protection

M. Ker, Wan-Yen Lin
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引用次数: 4

Abstract

A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.
基于可控硅器件的系统级ESD瞬态噪声检测电路的新设计
提出了一种新的基于晶闸管的瞬态检测电路,用于芯片上防系统级静电瞬态干扰的保护设计,并在硅片上进行了验证。在0.18 μm CMOS工艺上的实验结果表明,所提出的检测电路能够成功地记忆系统级静电感应电瞬变事件的发生。检测输出可配合固件操作自动执行系统恢复程序,从而有效提高微电子系统对系统级ESD测试的抗扰度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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