T. Hollstein, Faizal Arya Samman, A. Jaiswal, Haoyuan Ying, M. Glesner, K. Hofmann
{"title":"Invited paper: Design criteria for dependable System-on-Chip architectures","authors":"T. Hollstein, Faizal Arya Samman, A. Jaiswal, Haoyuan Ying, M. Glesner, K. Hofmann","doi":"10.1109/ReCoSoC.2011.5981518","DOIUrl":null,"url":null,"abstract":"The rapid improvement of semiconductor technologies is the enabling factor for the design of large-scale System-on-Chip (SoC) architectures. At the same time the scale-down of feature sizes in silicon technologies brings up new challenges as parameter variations of the transistor devices, an increased vulnerability for wear-out effects during the lifetime of the device and increased sensitivity for soft-errors. The overall system reliability is therefore an important topic to be addressed in the SoC design process as well as economic considerations related to manufacturing yield and lifetime maintainability. The aim of this contribution is to outline implications for the design process and to illustrate the dependability aspects at the example of SoC communication architectures being implemented as Networks-on-Chip (NoCs).","PeriodicalId":103130,"journal":{"name":"6th International Workshop on Reconfigurable Communication-Centric Systems-on-Chip (ReCoSoC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th International Workshop on Reconfigurable Communication-Centric Systems-on-Chip (ReCoSoC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ReCoSoC.2011.5981518","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The rapid improvement of semiconductor technologies is the enabling factor for the design of large-scale System-on-Chip (SoC) architectures. At the same time the scale-down of feature sizes in silicon technologies brings up new challenges as parameter variations of the transistor devices, an increased vulnerability for wear-out effects during the lifetime of the device and increased sensitivity for soft-errors. The overall system reliability is therefore an important topic to be addressed in the SoC design process as well as economic considerations related to manufacturing yield and lifetime maintainability. The aim of this contribution is to outline implications for the design process and to illustrate the dependability aspects at the example of SoC communication architectures being implemented as Networks-on-Chip (NoCs).