Invited paper: Design criteria for dependable System-on-Chip architectures

T. Hollstein, Faizal Arya Samman, A. Jaiswal, Haoyuan Ying, M. Glesner, K. Hofmann
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引用次数: 1

Abstract

The rapid improvement of semiconductor technologies is the enabling factor for the design of large-scale System-on-Chip (SoC) architectures. At the same time the scale-down of feature sizes in silicon technologies brings up new challenges as parameter variations of the transistor devices, an increased vulnerability for wear-out effects during the lifetime of the device and increased sensitivity for soft-errors. The overall system reliability is therefore an important topic to be addressed in the SoC design process as well as economic considerations related to manufacturing yield and lifetime maintainability. The aim of this contribution is to outline implications for the design process and to illustrate the dependability aspects at the example of SoC communication architectures being implemented as Networks-on-Chip (NoCs).
邀请论文:可靠的片上系统架构的设计标准
半导体技术的快速发展是设计大规模片上系统(SoC)架构的有利因素。与此同时,硅技术中特征尺寸的缩小带来了新的挑战,如晶体管器件的参数变化,器件寿命期间磨损效应的脆弱性增加以及对软误差的敏感性增加。因此,整体系统可靠性是SoC设计过程中需要解决的一个重要主题,同时也是与制造良率和寿命可维护性相关的经济考虑因素。本贡献的目的是概述对设计过程的影响,并举例说明作为片上网络(noc)实现的SoC通信架构的可靠性方面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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