Characteristic Analysis of Silicon Nanowire Tunnel Field Effect Transistor (NW-TFET)

P. Vimala, S. S, Likith Krishna L, Manjunath Bassapuri, Thiruveedi Manikanta
{"title":"Characteristic Analysis of Silicon Nanowire Tunnel Field Effect Transistor (NW-TFET)","authors":"P. Vimala, S. S, Likith Krishna L, Manjunath Bassapuri, Thiruveedi Manikanta","doi":"10.1109/CONECCT50063.2020.9198578","DOIUrl":null,"url":null,"abstract":"This paper describes the design structure of the nanowire tunnel field effect transistor (NW-TFET). The device simulation carried on nanohub device simulation tool. The parameters such as energy gap and drain current are analyzed for different values of drain voltage, channel length and channel thickness furthermore the drain current analysis are done for various dielectric values and observed that dielectric values are not having impact with NW-TFET","PeriodicalId":261794,"journal":{"name":"2020 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CONECCT50063.2020.9198578","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

This paper describes the design structure of the nanowire tunnel field effect transistor (NW-TFET). The device simulation carried on nanohub device simulation tool. The parameters such as energy gap and drain current are analyzed for different values of drain voltage, channel length and channel thickness furthermore the drain current analysis are done for various dielectric values and observed that dielectric values are not having impact with NW-TFET
硅纳米线隧道场效应晶体管(NW-TFET)特性分析
本文介绍了纳米线隧道场效应晶体管(NW-TFET)的设计结构。在nanohub器件仿真工具上进行器件仿真。分析了不同漏极电压、沟道长度和沟道厚度下的能隙和漏极电流等参数,并对不同介电值下的漏极电流进行了分析,发现介电值对NW-TFET没有影响
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信