{"title":"Specifying control of immunity to power line switching transients","authors":"K. Javor","doi":"10.1109/ISEMC.1994.385617","DOIUrl":null,"url":null,"abstract":"Theoretical and experimental investigation reveals discrepancies between common spike immunity requirements and real switching transients. In particular, excessively low source impedance forces unnecessary over-design of EMI filters. A test method using a LISN (line impedance stabilisation network) and switched high current load is investigated as an alternative transient generator, and the effect on filter-design is noted. This test method has dual advantages: a) it simulates real world transients in both amplitude, duration and source impedance, and b) it uses commonly available EMI test equipment and requires no expensive single application acquisitions.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1994.385617","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Theoretical and experimental investigation reveals discrepancies between common spike immunity requirements and real switching transients. In particular, excessively low source impedance forces unnecessary over-design of EMI filters. A test method using a LISN (line impedance stabilisation network) and switched high current load is investigated as an alternative transient generator, and the effect on filter-design is noted. This test method has dual advantages: a) it simulates real world transients in both amplitude, duration and source impedance, and b) it uses commonly available EMI test equipment and requires no expensive single application acquisitions.<>