Single event effect test results for candidate spacecraft electronics

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629791

K. Label, A. Moran, C. Seidleck, E. Stassinopoulos, J. Barth, P. Marshall, M. Carts, C. Marshall, J. Kinnison, B. Carkhuff

引用次数: 13

Abstract

We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links.

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候选航天器电子设备单事件效应试验结果

给出了候选航天器电子设备重离子和质子单事件效应(SEE)地面试验结果。各种数字，模拟和光纤设备进行了测试，包括dram, fpga和光纤链路。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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