Investigation of non-independent single event upsets in the TAOS GVSC static RAM

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629798

R. Hosken, R. Koga, B. Wilson, J. Marcelli, L. Laird

引用次数: 5

Abstract

Operation of the two TAOS Honeywell GVSC Flight Computers has been monitored over three years. SEUs in the Micron 32K/spl times/8 static RAM chips were characterized and some were found to have a common primary event.

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TAOS GVSC静态RAM中非独立单事件扰动的研究

两台TAOS霍尼韦尔GVSC飞行计算机的运行情况已经监测了三年多。对美光32K/spl times/8静态RAM芯片中的seu进行了表征，发现其中一些seu具有共同的主要事件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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