T. Nishioka, M. Nagasaqa, K. Igarashi, M. Kohmoto, S. Ito
{"title":"Special properties of molding compound for surface mounting devices","authors":"T. Nishioka, M. Nagasaqa, K. Igarashi, M. Kohmoto, S. Ito","doi":"10.1109/ECTC.1990.122253","DOIUrl":null,"url":null,"abstract":"An equation was developed for use in the design of a molding compound with increased resistance to the popcorn (package cracking) phenomenon. After evaluating many kinds of raw materials to achieve the goal, the authors chose two resin systems; one resin system is low glass transition temperature, Tg, while the other is high T/sub g/. High-density filling with silica helped improve the antipopcorn properties. It is concluded that low-Tg molding compounds have obvious advantages over high-Tg molding compounds in terms of the antipopcorn property. From this study, the authors recommend low-Tg molding compounds that have low-S, low-E, low-Df, and high- sigma properties to protect surface-mount devices from the popcorn phenomenon.<<ETX>>","PeriodicalId":102875,"journal":{"name":"40th Conference Proceedings on Electronic Components and Technology","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th Conference Proceedings on Electronic Components and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1990.122253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
An equation was developed for use in the design of a molding compound with increased resistance to the popcorn (package cracking) phenomenon. After evaluating many kinds of raw materials to achieve the goal, the authors chose two resin systems; one resin system is low glass transition temperature, Tg, while the other is high T/sub g/. High-density filling with silica helped improve the antipopcorn properties. It is concluded that low-Tg molding compounds have obvious advantages over high-Tg molding compounds in terms of the antipopcorn property. From this study, the authors recommend low-Tg molding compounds that have low-S, low-E, low-Df, and high- sigma properties to protect surface-mount devices from the popcorn phenomenon.<>