{"title":"Patching circuit design based on reserved CLBs","authors":"A. Matrosova, S. Ostanin, V. Andreeva","doi":"10.1109/AQTR.2016.7501284","DOIUrl":null,"url":null,"abstract":"The new approach to patching circuit design that allows masking any logical gate faults of combinational circuit (combinational part of sequential circuit) C is considered. It is supposed that only one gate may be fault. There are reserved Configurable Logic Blocks (CLBs) based on Look Up Tables (LUTs) that may mask a gate fault being included into the circuit through Multiplexer (MUX). The suggested approach to patching circuit design in contrast with currently in use allows keeping performance of a fault free circuit. It is suggested to include MUXs in those internal poles of circuit C that may have hard detectable faults. Experimental results showed that masking LUT based circuits are as a rule, rather simple.","PeriodicalId":110627,"journal":{"name":"2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AQTR.2016.7501284","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The new approach to patching circuit design that allows masking any logical gate faults of combinational circuit (combinational part of sequential circuit) C is considered. It is supposed that only one gate may be fault. There are reserved Configurable Logic Blocks (CLBs) based on Look Up Tables (LUTs) that may mask a gate fault being included into the circuit through Multiplexer (MUX). The suggested approach to patching circuit design in contrast with currently in use allows keeping performance of a fault free circuit. It is suggested to include MUXs in those internal poles of circuit C that may have hard detectable faults. Experimental results showed that masking LUT based circuits are as a rule, rather simple.