Physically Based Comparison of Current Noise Analysis of Si BJT's and SiGe HBT's

M. Martin-Martinez, D. Pardo
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Abstract

We present the first physically based conclusions of noise reduction in a HBT as compared with an identical BJT, based on the direct comparison of emitter, base and collector current fluctuations. In the HBT (as compared to the BJT), the largest reduction of the RF values of the spectral density of current fluctuations derives from the SJB and the SJBJE terms (22 % and 31 %, respectively). This is due to the fact that the base current in the HBT (mainly formed by holes crossing to the emitter) is strongly reduced as a consequence of the lower gap of the SiGe base. When studying the dc dependence of the different noise spectra, SJE(0), SJC(0) and SJEJC(0) undergo a pronounced rise in BJT and HBT as JC increases. However, the SJB(0) term can be neglected in the total noise analysis in the HBT for lower values of JC.
基于物理的Si BJT和SiGe HBT电流噪声分析比较
基于对发射极、基极和集电极电流波动的直接比较,我们提出了HBT中降噪的第一个基于物理的结论,并与相同的BJT进行了比较。在HBT中(与BJT相比),电流波动谱密度的RF值的最大减少来自SJB和SJBJE项(分别为22%和31%)。这是由于HBT中的基极电流(主要由穿过发射极的空穴形成)由于SiGe基极的较低间隙而大大减少。在研究不同噪声谱的dc依赖性时,SJE(0)、SJC(0)和SJEJC(0)的BJT和HBT随JC的增加而显著升高。然而,对于较低JC值,在HBT的总噪声分析中,SJB(0)项可以忽略。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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