The Notion of Cross Coverage in AMS Design Verification

Sayandeep Sanyal, Aritra Hazra, P. Dasgupta, Scott Morrison, S. Surendran, Lakshmanan Balasubramanian
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引用次数: 3

Abstract

Coverage monitoring is fundamental to design verification. Coverage artifacts are well developed for digital integrated circuits and these aim to cover the discrete state space and logical behaviors of the design. Analog designers are similarly concerned with the operating regions of the design and its response to an infinite and dense input space. Analog variables can influence each other in far more complex ways as compared to digital variables, consequently, the notion of cross coverage, as introduced in the analog context for the first time in this paper, is of high importance in analog design verification. This paper presents the formal syntax and semantics of analog cross coverage artifacts, the methods for evaluating them using our tool kit, and most importantly, the insights that can be gained from such cross coverage analysis.
AMS设计验证中的交叉覆盖概念
覆盖监视是设计验证的基础。覆盖工件在数字集成电路中得到了很好的发展,它们旨在覆盖设计的离散状态空间和逻辑行为。模拟设计人员同样关心设计的操作区域及其对无限和密集输入空间的响应。与数字变量相比,模拟变量可以以更复杂的方式相互影响,因此,本文首次在模拟环境中引入的交叉覆盖概念在模拟设计验证中具有重要意义。本文介绍了模拟交叉覆盖工件的正式语法和语义,使用我们的工具包评估它们的方法,最重要的是,可以从这种交叉覆盖分析中获得的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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