A 3.3-V 4-Mb nonvolatile ferroelectric RAM with a selectively-driven double-pulsed plate read/write-back scheme

Yeonbae Chung, Mun-Kyu Choi, Seung-Kyu Oh, Byung-Gil Jeon, Kang-Deog Suh
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引用次数: 10

Abstract

Summary form only given. Recently there has been a growing interest in ferroelectric RAM because of its great potential as a future nonvolatile memory. This work presents, for the first time, a 4 Mbit FRAM with novel design techniques: 1) open bitline cell array; 2) selectively-driven double-pulsed plate read/write-back scheme; 3) complementary data preset reference circuitry and relaxation/fatigue/imprint-free reference voltage generator; and 4) unintentional power-off data protection scheme. The prototype device incorporating these circuit schemes shows 75 ns access time, 21 mA active current at 3.3 V, 25/spl deg/C, 110 ns cycle. It measures 116 mm/sup 2/ with 0.6 /spl mu/m CMOS technology.
具有选择性驱动双脉冲板读/写回方案的3.3 v 4mb非易失性铁电RAM
只提供摘要形式。近年来,由于铁电存储器作为一种未来的非易失性存储器具有巨大的潜力,人们对其越来越感兴趣。这项工作首次提出了一个具有新颖设计技术的4 Mbit FRAM: 1)开放位线单元阵列;2)选择性驱动双脉冲极板读/写回方案;3)补充数据预置参考电路和松弛/疲劳/无压痕参考电压发生器;4)意外掉电数据保护方案。结合这些电路方案的原型器件显示75 ns的访问时间,21 mA的有源电流在3.3 V, 25/spl度/C, 110 ns周期。它的测量为116毫米/sup 2/,采用0.6 /spl μ m CMOS技术。
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