{"title":"An investigation of test approaches to CE07 of MIL-STD-461","authors":"M. Massaro, S. Banerjee","doi":"10.1109/ISEMC.1991.148253","DOIUrl":null,"url":null,"abstract":"The various test approaches to CE07 of MIL-STD-461 are examined. The CE07 (EMI) specification requires the measurement of short duration voltage transients produced by equipment onto their power supply lines. In particular, the effects of various types of line impedance stabilization networks (LISNs) on the measurement process are investigated. Time domain responses using three different LISNs are obtained for those cases in which the equipment being tested or the power source generated fast voltage transients. The advantages and disadvantages of using LISNs in the test process are discussed, as well as those test approaches that can avoid erroneous test results. The specialized test equipment needed to perform the test is discussed. The results presented can be used to determine the LISN configuration which produces the minimum amount of measurement distortion.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1991 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1991.148253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The various test approaches to CE07 of MIL-STD-461 are examined. The CE07 (EMI) specification requires the measurement of short duration voltage transients produced by equipment onto their power supply lines. In particular, the effects of various types of line impedance stabilization networks (LISNs) on the measurement process are investigated. Time domain responses using three different LISNs are obtained for those cases in which the equipment being tested or the power source generated fast voltage transients. The advantages and disadvantages of using LISNs in the test process are discussed, as well as those test approaches that can avoid erroneous test results. The specialized test equipment needed to perform the test is discussed. The results presented can be used to determine the LISN configuration which produces the minimum amount of measurement distortion.<>