{"title":"System-on-Chip Implementation of a Self-Configuration System for a Programmable Photodetector ASIC","authors":"Lucas Mombello, Nicolás Calarco, F. P. Quintian","doi":"10.1109/CAE48787.2020.9046361","DOIUrl":null,"url":null,"abstract":"In this work a self-configuration system for a photodetector sensor with programmable pixels is presented. The design is part of an optical encoder based on a non-diffractive light beam. The self-configuration is a routine of configurations, readings and successive reconfigurations whose main purpose is finding the center of the non-diffractive beam incident on the sensor, and then configure around it the detection pattern. This algorithm is implemented on a Zynq-7000 SoC and makes it possible to automate the alignment of the beam with the detection pattern, without using micrometric positioning procedures.","PeriodicalId":278190,"journal":{"name":"2020 Argentine Conference on Electronics (CAE)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Argentine Conference on Electronics (CAE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAE48787.2020.9046361","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In this work a self-configuration system for a photodetector sensor with programmable pixels is presented. The design is part of an optical encoder based on a non-diffractive light beam. The self-configuration is a routine of configurations, readings and successive reconfigurations whose main purpose is finding the center of the non-diffractive beam incident on the sensor, and then configure around it the detection pattern. This algorithm is implemented on a Zynq-7000 SoC and makes it possible to automate the alignment of the beam with the detection pattern, without using micrometric positioning procedures.