Reliability of high power QCW cm-bar arrays

Abstract

We report here the lifetime testing of 10 high power cm-bar arrays using an automated diode array reliability experiment. The devices are tested at 25°C/100A, with a pulse width of 200µs and a duty factor of 2%. Most devices survive more than 1.0×109 shots. Failure analysis results on the few failing devices reveal failure modes of mechanical stress, chemical contamination and thermal migration.