On-chip interconnect-aware design and modeling methodology based on high bandwidth transmission line devices

D. Goren, M. Zelikson, R. Gordin, I. Wagner, A. Barger, Alon Amir, B. Livshitz, Anatoly Sherman, Y. Tretiakov, R. Groves, J. Park, D. Jordan, Sue E. Strang, Raminderpal Singh, C. Dickey, D. Harame
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引用次数: 30

Abstract

This paper expands the on-chip interconnect-aware methodology for high-speed analog and mixed signal design, presented in D. Goren et al. (2002), into a wider class of designs, including dense layout CMOS design. The proposed solution employs a set of parameterized on-chip transmission line (T-line) devices for the critical interconnects, which is expanded to include coplanar structures while considering the silicon substrate effect. The generalized methodology contains treatment of the crossing line effects at the various design stages, including two way interactions between the post layout extraction tool and the T-line devices. The T-line device models are passive by construction, easily migratable among design environments, and allow for both time and frequency domain simulations. These models are verified by S-parameter measurements up to 110GHz, as well as by EM solver results. It is experimentally shown that the effect of properly designed discontinuities is negligible in most practical cases. The basic on-chip T-line methodology is being used extensively for numerous high-speed designs.
基于高带宽传输线器件的片上互连感知设计与建模方法
本文将D. Goren等人(2002)提出的用于高速模拟和混合信号设计的片上互连感知方法扩展到更广泛的设计类别,包括密集布局CMOS设计。该解决方案采用一组参数化片上传输线(t线)器件用于关键互连,并在考虑硅衬底效应的同时扩展到包括共面结构。广义的方法包括在各个设计阶段处理交叉线效应,包括后布局提取工具和t线装置之间的双向相互作用。t线器件模型是被动的,易于在设计环境之间迁移,并允许时域和频域模拟。这些模型通过高达110GHz的s参数测量以及EM求解器的结果进行了验证。实验表明,在大多数实际情况下,适当设计的不连续点的影响可以忽略不计。基本的片上t线方法被广泛用于许多高速设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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