Analysis of integrated metal seal ring resonance

2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) Pub Date : 2017-10-01 DOI:10.1109/EPEPS.2017.8329727

M. Jacques, D. Denis, S. Bouvier, Alireza Samani, F. Mounaim, D. Plant

引用次数: 0

Abstract

After linking an 80-GHz insertion loss peak in a silicon capacitor to the lambda/2 resonance of parasitic transmission lines enabled by its integrated metal seal ring, we develop a model characterizing such resonances.

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集成金属密封圈共振分析

在将硅电容器中的80 ghz插入损耗峰值与寄生传输线的λ /2谐振连接起来之后，我们开发了一个表征这种谐振的模型。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

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