Analysis of mismatched heterointerfaces by combinded HREM image processing and modeling

Abstract

Abstract Lattice mismatched heterointerfaces are classified by a simple five parameter configuration space which allows to quantify the following properties: gradual partial coherence, distribution and localisation of misfit dislocations, anisotropy of strain fields, elastic dissimilarity of the lattices. HREM images are digitally processed into one-dimensional strain and Fourier spectrum profiles along the interface at selected distance from the interface. The interpretation of these profiles as a Fourier expansion of displacement waves is justified through a link to continuum modelling approaches presented earlier. Limitations and microscope conditions for this simple direct image interpretation approach are listed and discussed.