Laser damage resistance of optical components in sub-picosecond regime in the infrared

M. Sozet, J. Néauport, E. Lavastre, N. Roquin, L. Gallais, L. Lamaignère
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Abstract

A rasterscan procedure is set to determine laser-induced damage densities in sub-picosecond regime at 1053nm on high-reflective coatings. Whereas laser-induced damage is usually considered deterministic in this regime, damage events occur on these structures for fluences lower than their intrinsic Laser-Induced Damage Threshold (LIDT). Damage densities are found to be high even for fluences as low as 20% of the LIDT. Scanning Electron Microscope observations of these “under threshold” damage sites evidence ejections of defects, embedded in the dielectric stack. It brings a new viewpoint for the qualification of optical components and for the optimization of manufacturing processes of coatings.
红外亚皮秒区光学元件的抗激光损伤性能
采用光栅扫描程序确定高反射涂层在1053nm处亚皮秒范围内的激光损伤密度。然而,在这种情况下,激光诱导损伤通常被认为是确定性的,损伤事件发生在这些结构上的影响低于其固有的激光诱导损伤阈值(LIDT)。发现即使影响低至LIDT的20%,损伤密度也很高。扫描电子显微镜观察到的这些“阈值以下”的损伤部位证明了嵌入在电介质堆栈中的缺陷的弹射。这为光学元件的质量鉴定和镀膜工艺的优化提供了新的视角。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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