{"title":"Design of Photonic Filter Using Metamaterial Based Defected Ternary Structure Under Normal Incidence","authors":"Nabanita Pramanik, A. Deyasi, A. Sarkar","doi":"10.1109/VLSIDCS47293.2020.9179900","DOIUrl":null,"url":null,"abstract":"Ripple factor of ternary photonic bandpass filter is analytically computed around 1.55 μm under normal incidence of electromagnetic wave. Parallel nanorod is considered as the metamaterial for the simulation purpose with air gap, and transfer matrix technique is adopted for the investigation. Improved noise rejection characteristics are obtained compared to the published results for positive index materials. Different structural parameters are varied to observe the bandwidth as well as noise variation for optimized performance. The structure is taken as defected one, where the density of point defect is within the limit of fabrication, so that the simulated findings can be taken as realistic.","PeriodicalId":446218,"journal":{"name":"2020 IEEE VLSI DEVICE CIRCUIT AND SYSTEM (VLSI DCS)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE VLSI DEVICE CIRCUIT AND SYSTEM (VLSI DCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIDCS47293.2020.9179900","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Ripple factor of ternary photonic bandpass filter is analytically computed around 1.55 μm under normal incidence of electromagnetic wave. Parallel nanorod is considered as the metamaterial for the simulation purpose with air gap, and transfer matrix technique is adopted for the investigation. Improved noise rejection characteristics are obtained compared to the published results for positive index materials. Different structural parameters are varied to observe the bandwidth as well as noise variation for optimized performance. The structure is taken as defected one, where the density of point defect is within the limit of fabrication, so that the simulated findings can be taken as realistic.