{"title":"EIR pareto as a prioritization tool for factory improvements","authors":"S. Saha, Chiang Yang, B. Auches","doi":"10.1109/ASMC.1995.484402","DOIUrl":null,"url":null,"abstract":"This paper will describe a methodology to prioritize factory indicators using EIR (EDO Improvement Ratio). The purpose of the EIR methodology is to set priorities between and within improvement teams in order to optimize the allocation of limited factory resources (both people and $) without defocusing from the overall factory priority-Maximum number of Good dice. Historically, during a ramp of a factory with a new technology, there are four indicators that compete for the limited resources of the factory: equipment installation, output improvement, line yield and die yield. In the initial phase of the ramp, equipment installation tends to be a priority and as the installations are completed, die yield takes the top priority followed by the other indicators. In a dynamic situation, it is not always easy to set priorities of the different teams (installation, improvement, line yield, die yield) with changing parameters (run rates, defects, utilization, losses) especially when the same resources are shared between multiple indicators.","PeriodicalId":237741,"journal":{"name":"Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1995.484402","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper will describe a methodology to prioritize factory indicators using EIR (EDO Improvement Ratio). The purpose of the EIR methodology is to set priorities between and within improvement teams in order to optimize the allocation of limited factory resources (both people and $) without defocusing from the overall factory priority-Maximum number of Good dice. Historically, during a ramp of a factory with a new technology, there are four indicators that compete for the limited resources of the factory: equipment installation, output improvement, line yield and die yield. In the initial phase of the ramp, equipment installation tends to be a priority and as the installations are completed, die yield takes the top priority followed by the other indicators. In a dynamic situation, it is not always easy to set priorities of the different teams (installation, improvement, line yield, die yield) with changing parameters (run rates, defects, utilization, losses) especially when the same resources are shared between multiple indicators.