More than Moore foundry: Challenges for process technology, process characterization and design enablement to address complex cyber physical systems in harsh environments

Steven Chen
{"title":"More than Moore foundry: Challenges for process technology, process characterization and design enablement to address complex cyber physical systems in harsh environments","authors":"Steven Chen","doi":"10.1109/VLSI-TSA.2014.6839699","DOIUrl":null,"url":null,"abstract":"Summary form only given. This presentation focuses on More than Moore technologies - the integration of additional features in digital CMOS technologies. Such additional features include high-voltage transistors with operating voltages up to 200V; non-volatile memories for trimming, program and data storage; and sensors for pressure or magnetic flux measurements. Complexity even increases when the circuit is operated in harsh environments with temperatures up to 175 degrees C. The covered application space spans motion and gesture sensing in today's mobile devices; automotive applications such as alternators, controllers for brushless DC electric motor with LIN or CAN interfaces as well as medical applications such as ultrasonic transducer arrays. Ideally, design engineers are able to achieve all of their design targets with a minimal number of iterations or even at first silicon to reduce time to market. The talk will help engineers understand the complexity of their designs and provide guidance on how to achieve their design targets. This presentation describes how to identify the right process technology, process characterization requirements in the context of high-temperature operations, and multiple design challenges such as ESD robustness, die size constraints, low noise and low power, and high reliability.","PeriodicalId":403085,"journal":{"name":"Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-TSA.2014.6839699","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Summary form only given. This presentation focuses on More than Moore technologies - the integration of additional features in digital CMOS technologies. Such additional features include high-voltage transistors with operating voltages up to 200V; non-volatile memories for trimming, program and data storage; and sensors for pressure or magnetic flux measurements. Complexity even increases when the circuit is operated in harsh environments with temperatures up to 175 degrees C. The covered application space spans motion and gesture sensing in today's mobile devices; automotive applications such as alternators, controllers for brushless DC electric motor with LIN or CAN interfaces as well as medical applications such as ultrasonic transducer arrays. Ideally, design engineers are able to achieve all of their design targets with a minimal number of iterations or even at first silicon to reduce time to market. The talk will help engineers understand the complexity of their designs and provide guidance on how to achieve their design targets. This presentation describes how to identify the right process technology, process characterization requirements in the context of high-temperature operations, and multiple design challenges such as ESD robustness, die size constraints, low noise and low power, and high reliability.
超越摩尔铸造厂:工艺技术、工艺表征和设计实现的挑战,以解决恶劣环境下复杂的网络物理系统
只提供摘要形式。本次演讲的重点是摩尔技术-集成数字CMOS技术的附加功能。这些附加功能包括工作电压高达200V的高压晶体管;用于修剪、程序和数据存储的非易失性存储器;以及用于压力或磁通量测量的传感器。当电路在温度高达175摄氏度的恶劣环境中运行时,复杂性甚至会增加。所涵盖的应用空间涵盖了当今移动设备中的运动和手势传感;汽车应用,如交流发电机,具有LIN或CAN接口的无刷直流电动机控制器,以及医疗应用,如超声波换能器阵列。理想情况下,设计工程师能够以最少的迭代次数实现所有的设计目标,甚至在第一个芯片上就能减少上市时间。该演讲将帮助工程师了解他们设计的复杂性,并为如何实现他们的设计目标提供指导。本演讲介绍了如何确定正确的工艺技术,高温操作背景下的工艺特性要求,以及多种设计挑战,如ESD稳健性,模具尺寸限制,低噪音和低功耗,以及高可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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